Browse NSN 5961-00-422-3775 Listing of Semiconductor Devic
It is our pleasure to inform you that part number 238274-1, 4-27746P, 4-27746P, 5082-2912, 5082-2912 listed under NSN 5961-00-422-3775 is now available and ready to ship from Fulfillment By ASAP. This part described as a Semiconductor Devic manufactured by L3 Communications Corp, Bastogi Sistemi Spa, Selex Es Spa, Avago Technologies U S Inc, Hewlett Packard Co. If you’d like a quick quote for NSN 5961-00-422-3775, please fill out the form from below. Are you looking to have it delivered today or tomorrow? We can help! Simply complete the Request For Quote (RFQ) form given below to get started, and we will get back to you within 15 minutes!
| Alternative NSN: 5961-00-422-3775 |
| Item Name: Semiconductor Devic |
| Federal Supply Class (FSC): 5961 Semiconductor Devices and Associated Hardware |
| NIIN: 004223775 |
| NCB Code: USA (00) |
| Manufacturers: Avago Technologies U S Inc , Bastogi Sistemi Spa , Hewlett Packard Co , L3 Communications Corp , Selex Es Spa , Whittaker Corporation |
| Part No | Manufacturer | Item Name | QTY | RFQ |
|---|---|---|---|---|
| 238274-1 | l3 communications corp | semiconductor devic | Avl | RFQ |
| 4-27746P | bastogi sistemi spa | semiconductor devic | Avl | RFQ |
| 4-27746P | selex es spa | semiconductor devic | Avl | RFQ |
| 5082-2912 | avago technologies u s inc | semiconductor devic | Avl | RFQ |
| 5082-2912 | hewlett packard co | semiconductor devic | Avl | RFQ |
| 84213-1 | whittaker corporation | semiconductor devic | Avl | RFQ |
Characteristics Data of NSN 5961004223775
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | GLASS ALL SEMICONDUCTOR DEVICE DIODE |
| ABHP | OVERALL LENGTH | 0.150 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.170 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| ABJT | TERMINAL LENGTH | 1.000 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| ADAV | OVERALL DIAMETER | 0.068 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.076 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| AFZC | FUNCTION FOR WHICH DESIGNED | SWITCHING |
| ALAS | INTERNAL CONFIGURATION | JUNCTION CONTACT ALL SEMICONDUCTOR DEVICE DIODE |
| ASCQ | INTERNAL JUNCTION CONFIGURATION | PN ALL SEMICONDUCTOR DEVICE DIODE |
| ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
| AXGY | MOUNTING METHOD | TERMINAL ALL SEMICONDUCTOR DEVICE DIODE |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 10.0 MINIMUM BREAKDOWN VOLTAGE, DC ALL SEMICONDUCTOR DEVICE DIODE |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 10.00 MICROAMPERES COLLECTOR CURRENT, DC PEAK ALL SEMICONDUCTOR DEVICE DIODE |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD ALL SEMICONDUCTOR DEVICE DIODE |
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